Zur Hauptnavigation / To main navigation

Zur Sekundärnavigation / To secondary navigation

Zum Inhalt dieser Seite / To the content of this page

Sekundärnavigation / Secondary navigation

Inhaltsbereich / Content

Atomic force microscope “Park XE-70”

  • scanning probe microscopy with cantilevers
  • contact and non-contact mode
  • topography and phase images
  • force distance curves and lateral forces
  • independent XY- and Z-scanner
  • XY range 5 or 50 µm
  • Z range 1.7 or 12 µm
  • sample size up to 100 x 100 mm with thicknesses up to 20 mm and weigth uo to 500 g