Nano Structuring Center

Atomic force microscope “Park XE-70”

  • scanning probe microscopy with cantilevers
  • contact and non-contact mode
  • topography and phase images
  • force distance curves and lateral forces
  • independent XY- and Z-scanner
  • XY range 5 or 50 µm
  • Z range 1.7 or 12 µm
  • sample size up to 100 x 100 mm with thicknesses up to 20 mm and weigth uo to 500 g
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