Atomic force microscope “Park XE-70”
- scanning probe microscopy with cantilevers
- contact and non-contact mode
- topography and phase images
- force distance curves and lateral forces
- independent XY- and Z-scanner
- XY range 5 or 50 µm
- Z range 1.7 or 12 µm
- sample size up to 100 x 100 mm with thicknesses up to 20 mm and weigth uo to 500 g